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Livres
Articles (109)
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Self-organized pattern formation of biomolecules at silicon surfaces: Intended application of a dislocation network

M. Kittler, X. Yu, O.F. Vyvenko, M. Birkholz, W. Seifert, M. Reiche, T. Wilhelm, T. Arguirov, A. Wolff, W. Fritzsche, M. Seibt

Journal:

Materials Science and Engineering: C

Année:

2006

Langue:

english

Fichier:

PDF, 901 KB

english, 2006

Combined XBIC/μ-XRF/μ-XAS/DLTS investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon

M. Trushin, O. Vyvenko, W. Seifert, M. Kittler, I. Zizak, A. Erko, M. Seibt, C. Rudolf

Journal:

physica status solidi (c)

Année:

2009

Langue:

english

Fichier:

PDF, 356 KB

english, 2009

Copper-Stabilized Si/Au Nanowhiskers for Advanced Nanoelectronic Applications

Maksimova, Ksenia Yu, Kozlov, Anatoly A., Shvets, Petr V., Koneva, Ulyana Yu, Yurkevich, Oksana V., Lebedev, Oleg I., Vyvenko, Oleg F., Mikhailovskii, Vladimir Yu, Goikhman, Aleksandr Yu

Journal:

ACS Omega

Année:

2018

Langue:

english

Fichier:

PDF, 5.86 MB

english, 2018

Scanning reflection ion microscopy in a helium ion microscope

Petrov, Yuri V, Vyvenko, Oleg F

Journal:

Beilstein Journal of Nanotechnology

Année:

2015

Langue:

english

Fichier:

PDF, 12.07 MB

english, 2015

Peculiarity of Electric Properties of Oxygen Implanted Silicon at Early Precipitation Stages

Danilov, Denis, Vyvenko, Oleg, Loshachenko, Anton, Sobolev, Nikolay

Journal:

physica status solidi (a)

Année:

2019

Langue:

english

Fichier:

PDF, 991 KB

english, 2019

Combined DLTS/MCTS investigations of deep electrical levels of regular dislocation networks in silicon

Trushin, M, Varlamov, A, Loshachenko, A, Vyvenko, O, Kittler, M

Journal:

Journal of Physics Conference Series

Année:

2019

Langue:

english

Fichier:

PDF, 1.52 MB

english, 2019

Extension of Hydrogen Passivation of Intragrain Defects and Grain Boundaries in Cast Multicrystalline Silicon

O. Krüger, W. Seifert, M. Kittler, O.F. Vyvenko

Journal:

physica status solidi (b)

Année:

2000

Langue:

english

Fichier:

PDF, 220 KB

english, 2000

ChemInform Abstract: Electrical and Recombination Properties of Copper-Silicide Precipitates in Silicon.

A. A. ISTRATOV, H. HEDEMANN, M. SEIBT, O. F. VYVENKO, W. SCHROETER, T. HEISER, C. FLINK, H. HIESLMAIR, E. R. WEBER

Journal:

ChemInform

Année:

1999

Fichier:

PDF, 25 KB

1999

Effect of the oxygen pressure during annealing on Tc and lattice parameter c of Bi-2212 single crystals

M. Yu. Vlasov, T. N. Kaminskaya, S. V. Moshkin, Dr. O. V. Frank-Kamenetskaya, O. F. Vyvenko, Yu. L. Kretser

Journal:

Crystal Research and Technology

Année:

1994

Langue:

english

Fichier:

PDF, 293 KB

english, 1994

Enhancement of IR emission from a dislocation network in Si due to an external bias voltage

X. Yu, O.F. Vyvenko, M. Reiche, M. Kittler

Journal:

Materials Science and Engineering: C

Année:

2007

Langue:

english

Fichier:

PDF, 485 KB

english, 2007

Silicon nanostructures for IR light emitters

M. Kittler, T. Arguirov, W. Seifert, X. Yu, G. Jia, O.F. Vyvenko, T. Mchedlidze, M. Reiche, J. Sha, D. Yang

Journal:

Materials Science and Engineering: C

Année:

2007

Langue:

english

Fichier:

PDF, 821 KB

english, 2007

XBIC/μ-XRF/μ-XAS analysis of metals precipitation in block-cast solar silicon

M. Trushin, W. Seifert, O. Vyvenko, J. Bauer, G. Martinez-Criado, M. Salome, M. Kittler

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2010

Langue:

english

Fichier:

PDF, 407 KB

english, 2010

Iron–oxygen interaction in silicon: A combined XBIC/XRF-EBIC-DLTS study of precipitation and complex building

M. Trushin, O. Vyvenko, W. Seifert, G. Jia, M. Kittler

Journal:

Physica B: Condensed Matter

Année:

2009

Langue:

english

Fichier:

PDF, 256 KB

english, 2009

Dislocation luminescence and electrical properties of dislocation network produced by silicon direct wafer bonding

Anton Bondarenko, Oleg Vyvenko, Nikolay Bazlov, Oleg Kononchuk

Journal:

Physica B: Condensed Matter

Année:

2009

Langue:

english

Fichier:

PDF, 332 KB

english, 2009

Cathodoluminescence imaging of dislocations in CdS: a new defocused-mirror technique

O. Vyvenko, A. Zozime, W. Schröter

Journal:

Materials Science and Engineering: B

Année:

1994

Langue:

english

Fichier:

PDF, 749 KB

english, 1994

Synchrotron-based investigation of iron precipitation in multicrystalline silicon

W. Seifert, O. Vyvenko, T. Arguirov, M. Kittler, M. Salome, M. Seibt, M. Trushin

Journal:

Superlattices and Microstructures

Année:

2009

Langue:

english

Fichier:

PDF, 1.40 MB

english, 2009

Capacitance Transient X-ray Absorption Spectroscopy of semiconducting structures

N. Bazlov, O. Vyvenko, A. Bondarenko, M. Trushin, A. Novikov, A. Vinogradov, M. Brzhezinskaya, R. Ovsyannikov

Journal:

Superlattices and Microstructures

Année:

2009

Langue:

english

Fichier:

PDF, 661 KB

english, 2009

Scanning X-ray excited optical luminescence microscopy of multi-crystalline silicon

O. Vyvenko, T. Arguirov, W. Seifert, I. Zizak, M. Trushin, M. Kittler

Journal:

physica status solidi (a)

Année:

2010

Langue:

english

Fichier:

PDF, 238 KB

english, 2010

A new method to investigate separately the properties of screw and edge dislocations in II-VI compound semiconductors

O. F. Vyvenko, A. A. Istratov

Journal:

physica status solidi (a)

Année:

1993

Langue:

english

Fichier:

PDF, 410 KB

english, 1993

Capacitance response due to recharging of extended defects attached to the edge of the space charge region of the Schottky diode

O. Vyvenko

Journal:

physica status solidi (c)

Année:

2005

Langue:

english

Fichier:

PDF, 317 KB

english, 2005

Recombination activity and electrical levels of “clean” and copper contaminated dislocations in p-type Si

O. F. Vyvenko, M. Kittler, W. Seifert, M. V. Trushin

Journal:

physica status solidi (c)

Année:

2005

Langue:

english

Fichier:

PDF, 89 KB

english, 2005

Luminescence of dislocation network in directly bonded silicon wafers

X. Yu, M. Kittler, O. F. Vyvenko, W. Seifert, T. Arguirov, T. Wilhelm, M. Reich

Journal:

physica status solidi (c)

Année:

2007

Langue:

english

Fichier:

PDF, 292 KB

english, 2007

Scanning probe studies of the electrical activity at interfaces formed by silicon wafer direct bonding

M. Ratzke, O. Vyvenko, X. Yu, J. Reif, M. Kittler, M. Reiche

Journal:

physica status solidi (c)

Année:

2007

Langue:

english

Fichier:

PDF, 277 KB

english, 2007

Electrical levels of nanoscale NiSi2 precipitates in silicon band gap

M. V. Trushin, O. F. Vyvenko

Journal:

physica status solidi (c)

Année:

2007

Langue:

english

Fichier:

PDF, 199 KB

english, 2007

Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon

Winfried Seifert, Oleg F. Vyvenko, Tzanimir Arguirov, Alexei Erko, Martin Kittler, Carsten Rudolf, Murielle Salome, Maxim Trushin, Ivo Zizak

Journal:

physica status solidi (c)

Année:

2009

Langue:

english

Fichier:

PDF, 789 KB

english, 2009

Combined XBIC/μ-XRF/μ-XAS/DLTS investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon

M. Trushin, O. Vyvenko, W. Seifert, M. Kittler, I. Zizak, A. Erko, M. Seibt, C. Rudolf

Journal:

physica status solidi (c)

Année:

2009

Fichier:

PDF, 450 KB

2009

Electrical characterization of silicon wafer bonding interfaces by means of voltage dependent light beam and electron beam induced current and capacitance of Schottky diodes

M. Trushin, O. Vyvenko, T. Mchedlidze, M. Reiche, M. Kittler

Journal:

physica status solidi (c)

Année:

2011

Langue:

english

Fichier:

PDF, 1.11 MB

english, 2011

Correlation between cathodoluminescent and electrical properties of dislocation network in the space charge region of Schottky-diode

Anton Bondarenko, Oleg Vyvenko, Ivan Isakov, Oleg Kononchuk

Journal:

physica status solidi (c)

Année:

2011

Langue:

english

Fichier:

PDF, 219 KB

english, 2011

Regular Dislocation Networks in Silicon as a Tool for Nanostructure Devices used in Optics, Biology, and Electronics

M. Kittler, X. Yu, T. Mchedlidze, T. Arguirov, O. F. Vyvenko, W. Seifert, M. Reiche, T. Wilhelm, M. Seibt, O. Voß, A. Wolff, W. Fritzsche

Journal:

Small

Année:

2007

Langue:

english

Fichier:

PDF, 532 KB

english, 2007

Light-induced noncovalent fixation of DNA and synthetic polyions on the surface of silicon single crystals

I. L. Volkov, N. V. Bazlov, A. S. Bondarenko, O. F. Vyvenko, N. A. Kas’yanenko

Journal:

Journal of Structural Chemistry

Année:

2009

Langue:

english

Fichier:

PDF, 1.31 MB

english, 2009

Applications of synchrotron radiation X-ray techniques on the analysis of the behavior of transition metals in solar cells and single-crystalline silicon with extended defects

T Buonassisi, M Heuer, O.F Vyvenko, A.A Istratov, E.R Weber, Z Cai, B Lai, T.F Ciszek, R Schindler

Journal:

Physica B: Condensed Matter

Année:

2003

Langue:

english

Fichier:

PDF, 220 KB

english, 2003

Defect recognition and impurity detection techniques in crystalline silicon for solar cells

A.A Istratov, H Hieslmair, O.F Vyvenko, E.R Weber, R Schindler

Journal:

Solar Energy Materials and Solar Cells

Année:

2002

Langue:

english

Fichier:

PDF, 174 KB

english, 2002

Scanning helium ion microscope: Distribution of secondary electrons and ion channeling

Yu. V. Petrov, O. F. Vyvenko, A. S. Bondarenko

Journal:

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques

Année:

2010

Langue:

english

Fichier:

PDF, 135 KB

english, 2010

Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bonding

X. Yu, O. Vyvenko, M. Kittler, W. Seifert, T. Mtchedlidze, T. Arguirov, M. Reiche

Journal:

Semiconductors

Année:

2007

Langue:

english

Fichier:

PDF, 201 KB

english, 2007

Experimental determination of dead layer thickness for excitons in a wide GaAs/AlGaAs quantum well

E. V. Ubyĭvovk, D. K. Loginov, I. Ya. Gerlovin, Yu. K. Dolgikh, Yu. P. Efimov, S. A. Eliseev, V. V. Petrov, O. F. Vyvenko, A. A. Sitnikova, D. A. Kirilenko

Journal:

Physics of the Solid State

Année:

2009

Langue:

english

Fichier:

PDF, 218 KB

english, 2009

Synthesis and structure of poly-3,4-ethylenedioxythiophene film with the inclusions of palladium nanoparticles

S. N. Eliseeva, E. V. Ubyivovk, A. S. Bondarenko, O. F. Vyvenko, V. V. Kondratiev

Journal:

Russian Journal of General Chemistry

Année:

2010

Langue:

english

Fichier:

PDF, 754 KB

english, 2010

DNA immobilization on n-type silicon surface and electrophysical properties of Au-DNA-(n-Si) structures

P. A. Sokolov, N. V. Bazlov, A. O. Puchkova, O. F. Vyvenko, N. A. Kasyanenko

Journal:

Protection of Metals and Physical Chemistry of Surfaces

Année:

2011

Langue:

english

Fichier:

PDF, 1.20 MB

english, 2011

X-ray beam induced current/microprobe x-ray fluorescence: synchrotron radiation based x-ray microprobe techniques for analysis of the recombination activity and chemical nature of metal impurities in silicon

Vyvenko, O F, Buonassisi, T, Istratov, A A, Weber, E R

Journal:

Journal of Physics Condensed Matter

Année:

2004

Langue:

english

Fichier:

PDF, 217 KB

english, 2004

X-ray beam induced current—a synchrotron radiation based technique for the in situ analysis of recombination properties and chemical nature of metal clusters in silicon

Vyvenko, O. F., Buonassisi, T., Istratov, A. A., Hieslmair, H., Thompson, A. C., Schindler, R., Weber, E. R.

Journal:

Journal of Applied Physics

Année:

2002

Langue:

english

Fichier:

PDF, 545 KB

english, 2002

Exponential analysis in physical phenomena

Istratov, Andrei A., Vyvenko, Oleg F.

Journal:

Review of Scientific Instruments

Année:

1999

Langue:

english

Fichier:

PDF, 652 KB

english, 1999

Photoluminescence properties of GaAs nanowire ensembles with zincblende and wurtzite crystal structure

B. V. Novikov, S. Yu. Serov, N. G. Filosofov, I. V. Shtrom, V. G. Talalaev, O. F. Vyvenko, E. V. Ubyivovk, Yu. B. Samsonenko, A. D. Bouravleuv, I. P. Soshnikov, N. V. Sibirev, G. E. Cirlin, V. G. Dubr

Journal:

physica status solidi (RRL) - Rapid Research Letters

Année:

2010

Langue:

english

Fichier:

PDF, 464 KB

english, 2010

Scaling of the energy gap withTcin Bi2Sr2CaCu2O8+δ

C. T. Simmons, S. L. Molodtsov, S. I. Fedoseenko, J. C. Allman, C. Laubschat, G. Kaindl, S. V. Moshikin, M. A. Kuzmina, M. U. Vlasov, O. F. Vyvenko

Journal:

Zeitschrift für Physik B Condensed Matter

Année:

1992

Langue:

english

Fichier:

PDF, 306 KB

english, 1992

Minority carrier conductive channel formed at a direct silicon-bonded interfacial grain boundary

X. Yu, W. Seifert, O. Vyvenko, M. Kittler

Journal:

Scripta Materialia

Année:

2009

Langue:

english

Fichier:

PDF, 579 KB

english, 2009

Impact of hydrogen on electrical levels and luminescence of dislocation network at the interface of hydrophilically bonded silicon wafers

Loshachenko, Anton, Bondarenko, Anton, Vyvenko, Oleg, Kononchuk, Oleg

Journal:

physica status solidi (c)

Année:

2013

Langue:

english

Fichier:

PDF, 244 KB

english, 2013

Dislocation luminescence in highly doped degenerated germanium at room temperature

Arguirov, Tzanimir, Vyvenko, Oleg, Oehme, Michael, Schulze, Jörg, Kittler, Martin

Journal:

physica status solidi (c)

Année:

2013

Langue:

english

Fichier:

PDF, 195 KB

english, 2013

Energetic spectra of dislocation networks produced by hydrophilic bonding of silicon wafers

Kolevatov, I., Trushin, M., Vyvenko, O., Kittler, M., Kononchuk, O.

Journal:

physica status solidi (c)

Année:

2013

Langue:

english

Fichier:

PDF, 591 KB

english, 2013

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Secondary electron emission spectra and energy selective imaging in helium ion microscope

Petrov, Yu., Vyvenko, O., Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Joy, David C., Maugel, Tim K.

Année:

2011

Langue:

english

Fichier:

PDF, 1.91 MB

english, 2011

Regularities in the formation of dislocation networks on the boundary of bonded Si(001) wafers

V. I. Vdovin, E. V. Ubyivovk, O. F. Vyvenko

Journal:

Semiconductors

Année:

2013

Langue:

english

Fichier:

PDF, 544 KB

english, 2013

Electron levels and luminescence of dislocation networks formed by the hydrophilic bonding of silicon wafers

A. S. Bondarenko, O. F. Vyvenko, I. A. Isakov

Journal:

Semiconductors

Année:

2013

Langue:

english

Fichier:

PDF, 185 KB

english, 2013

The electrically active centers in oxygen-implanted silicon

A. S. Loshachenko, O. F. Vyvenko, E. I. Shek, N. A. Sobolev

Journal:

Semiconductors

Année:

2013

Langue:

english

Fichier:

PDF, 159 KB

english, 2013